Applications of the Microchannel Plate for Mass Spectrometry

A microchannel plate (MCP) detector with active area of 10×2 cm2 is used as a position detector for mass spectrometry applications. The MCP detects electrons scattered by an MeV ion beam that goes through a thin Carbon foil which is placed at a 45° angle with respect to the beam direction. The scattered electrons' transverse motion is constrained by application of uniform electric and magnetic fields parallel to the axis of the MCP. The charge is then amplified by the MCP and deposited on a double‐delay line anode. Differential timing and charge partitioning are used to determine the horizontal and vertical positions, respectively, of the ion in a plane normal to the MCP axis. Results for a sample of Neodymium are discussed.