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B23-P-16Multi-layer Method combined with Nano-indentation, FIB and XTEM for Nano-hardness Measurement
B23-P-16Multi-layer Method combined with Nano-indentation, FIB and XTEM for Nano-hardness Measurement
2015
Ryoko Kurishiba
T Endo
N. Miyazaki
Yongming Wang
H. Oka
Y. Sato
A. Sawa
Naoyuki Hashimoto
S. Ohnuki
Keywords:
Materials science
Analytical chemistry
Nanoindentation
Nano-
Nanotechnology
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