Temperature dependence of resistance in percolation systems
1996
An analytical description of temperature dependence of resistance in a classical percolation system is presented for the first time. Three concentration ranges of conductive phase -- below and above percolation threshold as well as inside smearing region -- have been analyzed. Useability of presented results has been discussed for such random inhomogeneous media as cermet and polymer thick film resistors as well as cermet thin film ones.
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