Partial discharge erosion of nano-filled enameled wires subjected to high frequency waveforms

The accelerated degradation under high frequency AC voltages of enameled wires that are nano-filled is compared to enameled wires without nano-fillers. The surface roughness and erosion depth of wire specimens, aged in the presence of partial discharge (PD), are studied using a scanning electron microscope (SEM). Changes in the chemical bonding behavior of wire insulation due to PD erosion, are also assessed by Fourier transform infrared spectroscopy (FTIR). A comparative evaluation of the residual life of the wires, aged under high frequency AC waveforms reveals that the newly developed nano-filled enameled wires, especially those with fumed silica, attain a life that is twice that of conventional wires, which is a significant improvement.