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Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices | NIST
Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices | NIST
2006
J.M Ortiz Rodríguez
Allen R. Hefner
David W. Berning
Colleen E. Hood
Selim Olcum
Keywords:
Optoelectronics
Silicon carbide
High voltage
NIST
User interface
Materials science
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