Determination of the Optical Properties and Electrical Characteristics of Solid and Liquid Ytterbium with Ellipsometric Measurements

An ellipsometric method is used to study the optical properties of unoxidized surfaces of polycrystalline ytterbium film in the spectral range of 0.4–2.6 mm. The measured refractive indices and absorption coeffi cient of the film are used to calculate the dispersion dependences of the optical conductivity σ reflectivity R, the imaginary and real parts of the dielectric constant e1 and e2, and the characteristic electron energy loss functions Im(e–1). The infrared measurements are used in a two-band model for the conductivity to calculate the electronic characteristics of ytterbium in the solid and liquid states.