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Simple and efficient approach to improve hot carrier immunity of a p-LDMOSFET
Simple and efficient approach to improve hot carrier immunity of a p-LDMOSFET
2017
Sakai Atsushi
Eikyu Katsumi
Hiroki Fujii
Mori Takahiro
Akiyama Yutaka
Yamaguchi Yasuo
Keywords:
Immunity
Electronic engineering
Materials science
hot carrier stress
Optoelectronics
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