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Evaluation of trace metal contamination in SiO 2 by Pulse Photoconductivity Method
Evaluation of trace metal contamination in SiO 2 by Pulse Photoconductivity Method
2018
Shotaro Kuzukawa
Takahiro Ono
Tatsuro Kawano
Hiroki Matsuyama
Kazuhiro Kobayashi
Hiroshi Kubota
Takeshi Hashishin
Masao Yoshioka
Moriya Miyashita
Takahiro Maeta
Keywords:
Trace metal
Radiochemistry
Photoconductivity
Contamination
Pulse (signal processing)
Silicon
Materials science
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