Implement of a CCD spectrometer as experimental set-up to evaluate the emission of an electroluminescent device using the Taguchi methodology

Abstract Taguchi methodology was applied to study the influence of the electrical field variables on the emission yield and spectral response of a standard ZnS-based thin film electroluminescent device (TFEL). A measurement set-up based on a CCD spectrometer was designed and different TFEL working regimes were applied. As a result of the statistical analysis the optimal operation conditions were established and the influence of the external measurement factors were minimized.