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Structural Characterization of Buried Epitaxial b-FeSi2 Layers in (111) Silicon
Structural Characterization of Buried Epitaxial b-FeSi2 Layers in (111) Silicon
1994
J Tavares
Hugo Bender
Kim Kyllesbech Larsen
A. Lauwers
Karen Maex
Marc van Rossum
Keywords:
Crystallography
Epitaxy
Silicon
Materials science
Optoelectronics
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