Old Web
English
Sign In
Acemap
>
Paper
>
The Study of Abnormal Degradation in High-Voltage P-Type Mosfets with N+ Polysilicon Gate during AC Stress
The Study of Abnormal Degradation in High-Voltage P-Type Mosfets with N+ Polysilicon Gate during AC Stress
2015
Dong-jun Lee
Chang-Sub Lee
Sung-Hoi Hur
Du Heon Song
Byoungdeog Choi
Keywords:
High voltage
Electrical engineering
Engineering
Electronic engineering
Degradation (geology)
polysilicon gate
Optoelectronics
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]