ONE-HOT-coded command register for boundary scan test compatible devices

An integrated circuit chip that can be operated in a plurality of boundary scan test modes, in which at least one part of the circuit contained in the integrated circuit chip being tested is provided. The integrated circuit chip includes a boundary scan register and a command register. The boundary scan register is adapted to perform a test of the tested part of the circuit by supplying according to one of the boundary scan test modes the tested part of the circuit, a test signal and / or storing an output of the tested part of the circuit. The command register is to store a one-hot encoded command that identifies one of the boundary scan test modes established. The boundary scan register is further adapted to extract from the data stored in the command register one-hot encoded command which test of the portion of the circuit under test is to be performed. The integrated circuit chip and corresponding methods and hardware devices can benefit from increased testing flexibility and reduced time to market.