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Advances in Charge-Compensation in Secondary Ion Mass Spectrometry (SIMS)
Advances in Charge-Compensation in Secondary Ion Mass Spectrometry (SIMS)
2012
Richard L. Hervig
J. Chen
S. Schauer
B. D. Stanley
Gordon Moore
K. Roggensack
Keywords:
Analytical chemistry
Materials science
charge compensation
Secondary ion mass spectrometry
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