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Single Trap Profiling by Charge Pumping
Single Trap Profiling by Charge Pumping
2000
Serguei Okhonin
V. Meyer
A. Ils
Pierre Fazan
L. Risch
F. Hoffman
Keywords:
Electronic engineering
Analytical chemistry
Charge pump
Materials science
Profiling (computer programming)
Threshold voltage
charge pumping
Telegraphy
Correction
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