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Quantification of U f-valence in URu$_{2}$Si$_{2}$ from 3D Bulk Fermi Surface Topology
Quantification of U f-valence in URu$_{2}$Si$_{2}$ from 3D Bulk Fermi Surface Topology
2011
Jonathan D. Denlinger
O Krupin
J.W. Allen
Beomyoung Kim
Kristjan Haule
Kyoo Kim
Gabriel Kotliar
J. L. Sarrao
Nicholas P. Butch
M. B. Maple
Keywords:
Angle-resolved photoemission spectroscopy
Fermi surface
Electronic band structure
Photoemission spectroscopy
Atomic physics
Condensed matter physics
Inverse photoemission spectroscopy
Valence (chemistry)
Fermi level
Chemistry
Physics
Correction
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