Loss and the accuracy of the photonic crystal model in holey VCSELs

Aaron J. Danner,James J. Raftery,Paul O. Leisher,Erin A. Yamaoka,Sonia R. Lala,Michael L. Hwang,Kent D. Choquette

Loss and the accuracy of the photonic crystal model in holey VCSELs

2005

Aaron J. Danner
James J. Raftery
Paul O. Leisher
Erin A. Yamaoka
Sonia R. Lala
Michael L. Hwang
Kent D. Choquette

A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.

Keywords:

Optoelectronics
Optics
Semiconductor laser theory
Physics
Photonic crystal
optical refraction
Aperture
Parametric statistics
Refractive index
Etching
Photonic-crystal fiber

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