Structural properties of BaTiO3/ZnO heterostructures and interfaces

We report on the investigation of the structural properties of BaTiO3(BTO)/ZnO heterostructures grown by pulsed laser deposition (PLD). Special emphasis is devoted to the growth properties of BTO on ZnO and the BTO/ZnO interface. X‐ray diffraction (XRD) measurements of thick BTO layers reveal well (100)‐oriented BTO films. Sensitive UV‐excited Raman measurements of very thin BTO films on (00.1) ZnO reveal the possible presence of a hexagonal BTO phase close to the interface, in addition to the dominating tetragonal BTO phase.