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Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures
Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures
2019
Tim Dahmen
Pavel Potocek
Patrick Trampert
Maurice Peemen
Remco Schoenmakers
Keywords:
Pattern recognition
Analytical chemistry
Materials science
Segmentation
Scanning electron microscope
Deep learning
Artificial intelligence
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