Surface roughness characterization of plasma textured polycrystalline silicon solar wafer with the laser speckle technique
2020
Surface roughness characterization of plasma textured polycrystalline silicon solar wafer is estimated at different DC potentials by image processing. Laser speckle based Fractal dimension is a cross-scale surface descriptor of roughness. This investigation shows that surface roughness of the samples increases due to plasma processing in the measured range.
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