The practical realisation and performance of sprite detectors

Abstract This paper details the practical realisation of a novel device for use in thermal imaging systems—the SPRITE detector. This type of detector incorporates signal processing in the element by providing the time delay and integration functions, normally performed off the focal plane in conventional serial scanned systems. The detector has particular significance for high performance thermal imagers, allowing a more compact design with simplified electronics. The development of the fabrication technology for SPRITE is described together with the performance of devices for operation in both the 8–14 and the 3–5 μm bands.