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Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range
Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range
2017
Ueno Masahiro
Sakamoto Takashi
Toyoda Seiji
Sasaki Yuzo
Yamaguchi Joji
Sakamoto Tadashi
Fujimoto Masatoshi
Yamada Mahiro
Sugai Eiichi
Kodaira Toru
Keywords:
Wavelength
Optics
Physics
Resampling
wavelength shift
Materials science
Correction
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