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Comparing magnetic force microscopes images with different instruments using the CAMST reference samples
Comparing magnetic force microscopes images with different instruments using the CAMST reference samples
1998
Leon Abelmann
S. Porthun
M.A.M. Haast
J.C. Lodder
A. Moser
Margaret E. Best
P J A van Schendel
H.J. Hug
G.P. Heydon
A. N. Farley
Steve R. Hoon
P Rice
T. Pfaffelhuber
Keywords:
Analytical chemistry
Magnetic field
Physics
Microscope
Optics
Materials science
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