High-resolution imaging system and method based on CMOS-TDI (Complementary Metal Oxide Semiconductor-Time Delay and Integration) mode

The invention discloses a high-resolution imaging system and method based on a CMOS-TDI (Complementary Metal Oxide Semiconductor-Time Delay and Integration) mode, which mainly solves the problems in the prior art, such as low image obtaining efficiency and poor output image signal-to-noise ratio. The high-resolution imaging system comprises a signal control generator module, a movement route control cableway module, an area array CMOS plane module, a random exposure control module and an image reconstruction processor module. The high-resolution imaging method comprises the following steps of: 1, carrying out an initial operation; 2, carrying out push broom on s pixels by a prober; 3, generating a binary random sequence; 4, carrying out integral exposure by the prober; 5, carrying out internal transfer on photo-production charge pixels; 6, carrying out interline transfer on charges in a mask area; 7, judging whether a field scanning is completed or not; 8, outputting an observing value image; 9, optimizing and solving an L1-norm; and 10, obtaining a high-resolution image. The high-resolution imaging system and method provided by the invention have the advantages of simple circuit structure, low calculation complexity, high image obtaining efficiency and high output image signal-to-noise ratio.