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Total reflection x-ray fluorescence spectrometry of metal samples using synchrotron radiation SSRL
Total reflection x-ray fluorescence spectrometry of metal samples using synchrotron radiation SSRL
1992
F. Hegedus
P. Wobrauschek
Walter F. Sommer
Richard W. Ryon
Ch. Streli
P. Winkler
P Ferguson
Peter Kregsamer
R. Rieder
M. Victoria
Andy Horsewell
Keywords:
Synchrotron radiation
Total internal reflection
Mass spectrometry
X-ray fluorescence
Metal
Analytical chemistry
Materials science
Correction
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