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Thermal and mechanical limit study for Sandia Laboratories generation 1 and 2 hybird microcircuit technology
Thermal and mechanical limit study for Sandia Laboratories generation 1 and 2 hybird microcircuit technology
1975
H. C. Olson
Keywords:
Environmental tests
Nuclear engineering
Capacitor
Thermal
Integrated circuit
Microelectronics
Engineering
Correction
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