A phenomenological explanation of TES excess noise

The evidence of excess noise in the power spectrum of many natural systems that span over the mHz to the THz, such as biological system, superconductors at dendritic regime, Barkhausen noise of magnetic system and plasma emission from nanometric transistors, was observed and related to a class of statistical models of correlated processes. Intrinsic or induced fluctuations of the elementary processes taking place in transport phenomena couple each other giving rise to time-amplitude correlated avalanches. TES sensors for X-ray microcalorimeters have shown a clear evidence that this excess noise has typical spectral behavior spanning from 100 Hz to 10 kHz. We present an analysis of the excess noise using this statistical avalanche model of TES operating on Si substrate and suspended SiN membrane.