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2009 27th IEEE VLSI Test Symposium
2009 27th IEEE VLSI Test Symposium
2009
Thomas Ziaja
Nicolas Houarche
M Comte
M. Renovell
Alejandro Czutro
Piet Engelke
Ilia Polian
Bernd Becker
Masayuki Arai
Akifumi Suto
Kazuhiko Iwasaki
Katsuyuki Nakano
Michihiro Shintani
Kazumi Hatayama
Takashi Aikyo
Keywords:
Software engineering
Very-large-scale integration
IEEE 802.6
Computer science
vlsi test
Computer architecture
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