Preparation and Characterization of Cobalt Doped ZnO and TiO 2

Synthesis and characterization of transparent Co-doped ZnO and TiO 2 diluted magnetic semiconductor (DMS) films are described. The films are prepared by single sputtering deposition. They are ferromagnetic at temperatures as high as 350 K. The films were characterized by X-ray diffraction (XRD), X-ray photoemission spectroscopy (XPS), X-ray fluorescence (XRF). Optical transparency was measured on UV/VIS spectrometer. The Codoped ZnO films had wurtzite structure similar to ZnO with the (002) preferential texture. Neither XRD nor XPS showed any presence of pure Co or CoO in the samples. The Co-doped TiO 2 samples were amorphous, and some unoxidized Co was found in the films.