Analyzing single event upset on Kintex-7 Field-Programmable-Gate-Array with random fault injection method

Abstract In this paper, the bitstream of 28 nm field-programmable-gate-array was resolved. The relationship between the frame address and the resource was obtained. The fault injection platform was designed based on the information of the bitstream which obtained by partial reconfiguration. With this fault injection platform, the equivalence of the global fault and random fault injections was verified. Also, the sensitivities of different circuits were tested by random fault injection. The reinforcement effect of the triple module redundancy for sensitive resources in 28 nm FPGA was also be tested.