Fourier‐Transform Infrared Absorption Study of the Nanocluster Carbon Thin Films Grown Using Cathodic Arc Process

Nanocluster carbon thin films are deposited on Silicon Substrate using Cathodic Arc process. These films are mixed phased materials containing both sp2 and sp3 bondings. The surface morphology is characterized by Fourier‐Transform Infrared Spectroscopy (FTIR) to find out different vibrational modes in these films. The various bendings modes with Olefinic and aromatic structures are associated with a broad absorption band between 1130 and 1550 cm−1. The peaks in and around 2900 cm−1 shows various stretching modes of C‐Hn (n = 1,2,3).