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Nanostructural characterization of Mg implanted GaN layers by STEM and 3DAP
Nanostructural characterization of Mg implanted GaN layers by STEM and 3DAP
2020
Tadakatsu Ohkubo
Ashutosh Kumar
Jun Uzuhashi
Ryo Tanaka
Shinya Takashima
Masaharu Edo
Kazuhiro Hono
Keywords:
Optoelectronics
Atom probe
Scanning transmission electron microscopy
Materials science
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