Manganese K- and L3-Edge X-Ray Absorption Fine Structure Study of Zn1-xMnxTe
2013
High-resolution synchrotron radiation x-ray absorption data on Mn K- and L3-edge for semimagnetic semiconductor Zn1-xMnxTe bulk materials are presented. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program, and the chemical bonds of Mn-Te are obtained. The x-ray absorption near-edge structure of the Mn K- and L3-edges are investigated, and the electronic structure of Zn1-xMnxTe with various compositions are studied.
Keywords:
- Synchrotron radiation
- Metallurgy
- Crystallography
- Chemical bond
- X-ray absorption fine structure
- Materials science
- Extended X-ray absorption fine structure
- XANES
- Electronic structure
- Semiconductor
- Surface-extended X-ray absorption fine structure
- Molecular physics
- Absorption (pharmacology)
- Composite material
- Manganese
- Analytical chemistry
- Correction
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