Trends in synchrotron-based tomographic imaging: the SLS experience
2006
Synchrotron-based X-ray Tomographic Microscopy (SRXTM) is nowadays a powerful technique for non-destructive,
high-resolution investigations of a broad kind of materials. High-brilliance and high-coherence third generation
synchrotron radiation facilities allow micrometer and sub-micrometer, quantitative, three-dimensional
imaging within very short time and extend the traditional absorption imaging technique to edge-enhanced
and phase-sensitive measurements. At the Swiss Light Source TOMCAT, a new beamline for TOmographic Microscopy and Coherent rAdiology experimenTs, has been recently built and started regular user operation in
June 2006. The new beamline get photons from a 2.9 T superbend with a critical energy of 11.1 keV. This makes
energies above 20 keV easily accessible. To guarantee the best beam quality (stability and homogeneity), the
number of optical elements has been kept to a minimum. A Double Crystal Multilayer Monochromator (DCMM)
covers an energy range between 8 and 45 keV with a bandwidth of a few percent down to 10 -4 . The beamline
can also be operated in white-beam mode, providing the ideal conditions for real-time coherent radiology. This
article presents the beamline design, its optical components and the endstation. It further illustrates two recently
developed phase contrast techniques and finally gives an overview of recent research topics which make intense
use of SRXTM.
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