Super computing system oriented self-gating boundary scan test method and device

The invention discloses a super computing system oriented self-gating boundary scan test method and a super computing system oriented self-gating boundary scan test device. The method comprises the following steps of: calculating to obtain the optimum test joint test action group (JTAG) line according to an input target main board number, a test command and test concurrency to determine a JTAG output port of a monitoring main board and send a control signal; and receiving the control signal of a JTAG gate by using a crossbar network on a rear panel, and changing turn-on and turn-off of each switch in the crossbar switch network according to the control signal to finish gating and executing a test command by using the gated JTAG output port. The device comprises a JTAG controller and the JTAG gate which are positioned on the monitoring main board, and a crossbar switch network module positioned on the rear panel. The method and the device have the advantages of simple structure, few rear panel wire, high test flexibility, high test efficiency and balanced JTAG line load.