Electron-Induced Displacement Damage Effects in CCD s

We compare differences in parametric degradation for CCDs irradiated to the same displacement damage dose with 2-MeV, 10-MeV, and 50-MeV electrons. Charge transfer efficiency degradation was observed to not scale well with non-ionizing energy loss (NIEL) for small signals. Short term annealing of mean dark current in a CCD sample irradiated with 2-MeV electrons at -85C is discussed, as well as additional annealing achieved by warming to temperatures up to and including room temperature. In contrast, charge transfer inefficiency was not observed to anneal following room temperature cycling for the sample irradiated at -85C