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Attofarad capacitance measurement on organic thin films using Scanning Microwave Microscopy
Attofarad capacitance measurement on organic thin films using Scanning Microwave Microscopy
2011
Shijie Wu
Jing-Jiang Yu
Keywords:
Network analyzer (electrical)
Thin film
Reflection coefficient
Microscopy
Scanning capacitance microscopy
Capacitance
Contact area
Optics
Microwave
Materials science
Optoelectronics
Correction
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