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Investigations of the Thermal Behaviour of Low-k Dielectrics Based on Smart Designed Electromigration Lines
Investigations of the Thermal Behaviour of Low-k Dielectrics Based on Smart Designed Electromigration Lines
1998
A.M. Ionescu
F. Mondon
G. Reimbold
D. Blachier
L. Arnaud
P. Waltz
Y. Morand
Keywords:
Analytical chemistry
Thermal
Electronic engineering
Electromigration
Dielectric
Thermal laser stimulation
Materials science
Thermal resistance
Thermal conductivity
Correction
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