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Characterization of Strain in Si for High Performance MOSFETs
Characterization of Strain in Si for High Performance MOSFETs
2007
Daisuke Kosemura
Yasuto Kakemura
Tetsuya Yoshida
Atsushi Ogura
Masayuki Kohno
Tatsuo Nishita
Toshio Nakanisi
Keywords:
Analytical chemistry
Strain (chemistry)
Materials science
Optoelectronics
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