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Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS
Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS
2020
Ho-Leung Chan
Matthew Mecklenburg
William B. Hubbard
Jared J. Lodico
Brian Zutter
B. C. Regan
Keywords:
Optoelectronics
Thin film
Materials science
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