The atomic structure of the Si(111)-Pb buried interface grown on the reconstruction

We present surface X-ray diffraction measurements of the interface grown from the incommensurate reconstruction and show that, in contrast to the starting surface, the interface comprises the junction between unreconstructed, bulk-like Si(111) and disordered, bulk-like Pb(111). This interface is contrasted with the interface formed by growth on the Si(111)-(7 × 7)-Pb reconstruction at which the starting reconstruction is preserved.