Pattern Recognition Method for Metric Space by Four Points Embedding.

In solving pattern recognition problem in the Euclidean space, prototypes representing classes are de ned. On the other hand in the metric space, Nearest Neighbor method and K-Nearest Neighbor method are frequently used without de ning any prototypes. In this paper, we propose a new pattern recognition method for the metric space that can use prototypes which are the centroid of any three patterns in a class. This method is based on the theorem that four points of any metric space can be embedded into the Euclidean space by an appropriate metric transform.