Infrared thermographic test for removing background reflection based on polarization theory

Abstract The infrared thermographic test is often influenced by the environment, which sometimes causes false defect detection. Thus, the background reflection from sunlight or neighboring structures is a serious problem. In the present study, we solve this problem by quantitatively separating the background reflection and the defects by using the polarization theory for dielectrics. The proposed program can remove the background reflection and obtain a thermal image including only the emitted energy from the defect part. According to the experimental results, we establish a reflection removal infrared thermographic test using the polarization theory for dielectrics.