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Characterization of dielectric function for metallic thin films based on ellipsometric parameters and reflectivity
Characterization of dielectric function for metallic thin films based on ellipsometric parameters and reflectivity
2019
Jiamin Liu
Jianbin Lin
Hao Jiang
Honggang Gu
Xiuguo Chen
Chuanwei Zhang
Guanglan Liao
Shiyuan Liu
Keywords:
Thin film
Reflectivity
Dielectric
Condensed matter physics
Physics
Atomic physics
Metal
Correction
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