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Comparison of X-ray Nanotomography and FIB-SEM in Quantifying the Composite LSM/YSZ SOFC Cathode Microstructure
Comparison of X-ray Nanotomography and FIB-SEM in Quantifying the Composite LSM/YSZ SOFC Cathode Microstructure
2011
George J. Nelson
William M. Harris
Jeffrey J. Lombardo
John R. Izzo
Wilson K. S. Chiu
Pietro Tanasini
Marco Cantoni
Jan Van herle
Christos Comninellis
Joy C. Andrews
Yijin Liu
P. Pianetta
Yong S. Chu
Keywords:
Yttria-stabilized zirconia
Microstructure
Ceramic materials
X-ray
Cathode
Materials science
Composite material
Composite number
x ray nanotomography
Correction
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