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Simulation Studies of Fluorine-Induced Corrosion and Defects on Microchip Al Bondpads in Wafer Fabrication
Simulation Studies of Fluorine-Induced Corrosion and Defects on Microchip Al Bondpads in Wafer Fabrication
2010
Hua Younan
Nistala Ramesh Rao
Keywords:
Optoelectronics
Wafer fabrication
Materials science
Corrosion
Fluorine
Correction
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