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Closed-loop Junction Temperature Control of SiC MOSFETs in DC Power Cycling for Accurate Reliability Assessments
Closed-loop Junction Temperature Control of SiC MOSFETs in DC Power Cycling for Accurate Reliability Assessments
2021
Bhanu Teja Vankayalapati
Bilal Akin
Keywords:
closed loop
Materials science
Power cycling
Automotive engineering
Reliability (semiconductor)
Junction temperature
Correction
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