Optical material characterization through BSDF measurement and analysis
2010
The optical scattering signature and the absorbance of a material are of interest in a variety of engineering applications,
particularly for those pertaining to optical remote sensing. The John Hopkins University Applied Physics Laboratory
has developed an experimental capability to measure in-plane bidirectional scattering distribution functions to retrieve
optical properties of materials. These measurements are supported at high angular resolution with wavelengths that
span the ultra-violet to the long-wave infrared. Models have been developed to fit Lambertian, diffuse, near-specular,
and specular scattering at a range of incident angles. Useful material properties can then be determined through analysis
of the modeled BSDF. Optical characterization results are shown for a variety of materials, including paints, metals,
optical windows, and leaves.
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