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High Temperature Gate Voltage Step-by-Step Test to Assess Reliability Differences in 1200 V SiC MOSFETs
High Temperature Gate Voltage Step-by-Step Test to Assess Reliability Differences in 1200 V SiC MOSFETs
2020
Elena Mengotti
Enea Bianda
Stephan Wirths
David Baumann
Jason Bettega
Joni Jormanainen
Keywords:
step test
Optoelectronics
gate voltage
Composite material
Materials science
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