Release of Kr, Ag, Sn, I and Xe from UCx targets
2006
Abstract The release properties of a UC x thick target associated with a hot plasma ion source have been studied. Measurements have been performed for various elements: Kr, Ag, Sn, I and Xe. The analysis is made assuming pure diffusion or pure effusion as the release processes. The results obtained are compared to the data available in the literature.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
26
References
9
Citations
NaN
KQI