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Electromagnetic Susceptibility Of TTL And CMOS Inverters. Influence Of Pulseform And External Elements
Electromagnetic Susceptibility Of TTL And CMOS Inverters. Influence Of Pulseform And External Elements
1998
T. Weissgerber
D. Peier
H Hirsch
Keywords:
Mathematical optimization
Electromagnetic compatibility
CMOS
Immunity Testing
Mathematics
Electrical impedance
Voltage
Electronic engineering
digital integrated circuits
electromagnetic susceptibility
Physics
Electrical engineering
Correction
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